Tasks
- Optical defect analysis, quality control and documentation of ICs, FPGAs, BGAs
- one-sided, two-sided or multilayer PCB inspection
- Detection of cracks, short circuits, defective electrical connections or bridges
- optical post-bond / post-reflow inspection with pin counting and component identification
- Detection of irregularities in wafer coatings
- Analysis of impurities, cracks or identification of particles and scratches
Solution
- IM-compact M or IM-linea XL in monochrome or colour version
- application-optimised optoelectronics available in USB 3.1 or GigE - Plug&Play
- easy-to-use and free OptoViewer 2.0 software
- various SDK and toolkits as well as BV plug-ins for machine integration
Added value
- All-in-one digital microscope optimised for mobile use
- More compact than conventional microscopes
- reliable image data with highest image quality and good colour fidelity
- good price-performance ratio with software support
Application note (one page)
Application note (four pages)