Laser Fault Injection uses the photoelectric effect coming from the interaction of photons of a laser source with a semiconductor. The laser radiation can generate an electron-hole pair in these regions if its energy exceeds the semiconductor band gap.
We designed with a market leading partner a specific system to adress this effect. It is a
- Modular microscope system
- Adaptable to multi-wavelength lasers
- Compatible with Free Beam or Fiber Coupled Lasers
- One or two laser points
- Monitor diode for laser activation detection
- Fixed or Mobile Laser Spots
For testing credit card, smartcard & FPGA chip security